SEIKA Digital Image Corporation.

 
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Product List

Product List

PIV 粒子画像流速計
PIV（Particle Image Velocimetry）
マイクロPIV・LIFシステム
Micro PIV/LIF system
デジタルシュリーレンシステム
Digital Schlieren
画像法粒子解析 (シャドウグラフ)
Particle Image Analysis Method: Shadowgraph System
Laser-induced fluorescence method: LIF system
Laser-induced fluorescence method: LIF system
LDV レーザードップラー流速計
DIC system
Porometer
Pore ​​size distribution measurement PorometerPDI
ProductList
  • PIV（Particle Image Velocimetry）
  • Digital Schlieren System (DSS) BOS method, visualization method
  • Particle Image Analysis Method: Shadowgraph System
  • Laser-induced fluorescence method: LIF system
  • Non-contact strain/displacement measurement Digital image correlation method: DIC system
  • Pore ​​size distribution measurement Porometer
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SEIKA Digital Image Corporation.

Koraku  Kokusai  Building  2F, 1-5-3 Koraku, Bunkyo-ku,Tokyo, Japan

  • TEL:+81-3-3830-2300
  • FAX:+81-3-5802-8777
 
  • Product List
    • PIV（Particle Image Velocimetry）
    • Micro-area fluid measurement Micro PIV/Micro LIF
    • Digital Schlieren System (DSS) BOS method
    • Particle Image Analysis Method: Shadowgraph System
    • Laser-induced fluorescence method: LIF system
    • Non-contact strain/displacement measurement Digital image correlation method: DIC system
    • Pore ​​size distribution measurement Porometer
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